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spi: add new test for timing and mode
New unit tests added ------------------------ **Local:** Local test uses the GPIO matrix to connect the master and the slave on the same board. When the master needs the iomux, the master uses the GPIOs of its own, the slave connect to the pins by GPIO matrix; When the slave needs the iomux, the slave uses the GPIOs of its own, the master connects to the pins by GPIO matrix. - Provide a new unit test which performs freq scanning in mode 0. It scans frequency of 1M, 8M, 9M and all frequency steps up to the maximum frequency allowed. **M & S**: Master & slave tests performs the test with two boards. The master and slave use iomux or gpio matrix according to the config. - Provide a new unit test which performs freq scanning in mode 0. It scans frequency of 1M, 8M, 9M and all frequency steps up to the maximum frequency allowed. - Provide a new unit test which performs mode test with significant frequencies. It tests mode 0,1,2,3 with low frequency, and the maximum frequency allowed.
This commit is contained in:
committed by
Michael (XIAO Xufeng)
parent
155006243e
commit
41e58bc419
@@ -1629,6 +1629,31 @@ UT_012_05:
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- UT_T1_1
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- 8Mpsram
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UT_013_01:
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<<: *unit_test_template
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tags:
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- ESP32_IDF
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- Example_SPI_Multi_device
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UT_013_02:
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<<: *unit_test_template
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tags:
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- ESP32_IDF
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- Example_SPI_Multi_device
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UT_013_03:
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<<: *unit_test_template
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tags:
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- ESP32_IDF
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- Example_SPI_Multi_device
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UT_013_04:
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<<: *unit_test_template
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tags:
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- ESP32_IDF
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- Example_SPI_Multi_device
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- psram
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UT_014_01:
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<<: *unit_test_template
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tags:
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