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ci: disable p4 rev3 invalid tests temporarily for v5.5 only

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This commit is contained in:
igor.udot
2025-11-21 11:28:08 +08:00
parent a3bca48289
commit 82cf7083e3
12 changed files with 53 additions and 15 deletions
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components/esp_driver_i2c/test_apps/.build-test-rules.yml
+4
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@@ -3,5 +3,9 @@
components/esp_driver_i2c/test_apps/i2c_test_apps:
disable:
- if: SOC_I2C_SUPPORTED != 1
disable_test:
- if: IDF_TARGET in ["esp32h21", "esp32p4"]
temporary: true
reason: p4 rev3 migration # TODO: IDF-14395
depends_components:
- esp_driver_i2c
components/esp_driver_i2c/test_apps/i2c_test_apps/pytest_i2c.py
+1
View File
@@ -15,6 +15,7 @@ from pytest_embedded_idf.utils import soc_filtered_targets
],
indirect=True,
)
@pytest.mark.temp_skip_ci(targets=['esp32p4'], reason='p4 rev3 migration # TODO: IDF-14395')
@idf_parametrize('target', ['supported_targets'], indirect=['target'])
def test_i2c(dut: Dut) -> None:
dut.run_all_single_board_cases()
components/esp_driver_spi/test_apps/.build-test-rules.yml
+12
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@@ -18,15 +18,27 @@ components/esp_driver_spi/test_apps/master:
components/esp_driver_spi/test_apps/param:
disable:
- if: SOC_GPSPI_SUPPORTED != 1
disable_test:
- if: IDF_TARGET in ["esp32h21", "esp32p4"]
temporary: true
reason: p4 rev3 migration # TODO: IDF-14399
<<: *spi_depends_default
components/esp_driver_spi/test_apps/slave:
disable:
- if: SOC_GPSPI_SUPPORTED != 1
disable_test:
- if: IDF_TARGET in ["esp32h21", "esp32p4"]
temporary: true
reason: p4 rev3 migration # TODO: IDF-14399
<<: *spi_depends_default
components/esp_driver_spi/test_apps/slave_hd:
disable:
- if: SOC_GPSPI_SUPPORTED != 1
- if: SOC_SPI_SUPPORT_SLAVE_HD_VER2 != 1
disable_test:
- if: IDF_TARGET in ["esp32h21", "esp32p4", "esp32c61"]
temporary: true
reason: p4 rev3 migration # TODO: IDF-14399
<<: *spi_depends_default
components/esp_driver_spi/test_apps/param/pytest_spi_param.py
+1
View File
@@ -5,6 +5,7 @@ from pytest_embedded_idf.utils import idf_parametrize
@pytest.mark.generic
@pytest.mark.temp_skip_ci(targets=['esp32p4'], reason='p4 rev3 migration # TODO: IDF-14399')
@idf_parametrize('target', ['supported_targets'], indirect=['target'])
def test_param_single_dev(case_tester) -> None: # type: ignore
case_tester.run_all_normal_cases(reset=True)
components/esp_driver_spi/test_apps/slave/pytest_spi_slave.py
+1
View File
@@ -6,6 +6,7 @@ from pytest_embedded_idf.utils import idf_parametrize
@pytest.mark.generic
@pytest.mark.parametrize('config', ['release', 'iram_safe'], indirect=True)
@pytest.mark.temp_skip_ci(targets=['esp32p4'], reason='p4 rev3 migration # TODO: IDF-14399')
@idf_parametrize('target', ['supported_targets'], indirect=['target'])
def test_slave_single_dev(case_tester) -> None: # type: ignore
case_tester.run_all_normal_cases(reset=True)
components/esp_driver_spi/test_apps/slave_hd/pytest_spi_slave_hd.py
+2 -1
View File
@@ -8,6 +8,7 @@ from pytest_embedded_idf.utils import idf_parametrize
@pytest.mark.generic
@pytest.mark.parametrize('config', ['release'], indirect=True)
@pytest.mark.temp_skip_ci(targets=['esp32p4', 'esp32c61'], reason='p4 rev3 migration # TODO: IDF-14399')
@idf_parametrize(
'target',
['esp32s2', 'esp32s3', 'esp32c2', 'esp32c3', 'esp32c5', 'esp32c6', 'esp32c61', 'esp32h2', 'esp32p4'],
@@ -20,11 +21,11 @@ def test_slave_hd_single_dev(case_tester) -> None: # type: ignore
# if `test_env` not defined, will run on `generic_multi_device` by default
@pytest.mark.generic_multi_device
@pytest.mark.parametrize('count, config', [(2, 'release')], indirect=True)
@pytest.mark.temp_skip_ci(targets=['esp32p4', 'esp32c61'], reason='p4 rev3 migration # TODO: IDF-14399')
@idf_parametrize(
'target',
['esp32s2', 'esp32s3', 'esp32c2', 'esp32c3', 'esp32c5', 'esp32c6', 'esp32h2', 'esp32p4'],
indirect=['target'],
)
@pytest.mark.temp_skip_ci(targets=['esp32p4'], reason='p4 rev3 migration # TODO: IDF-14399')
def test_slave_hd_multi_dev(case_tester) -> None: # type: ignore
case_tester.run_all_multi_dev_cases(reset=True)
components/usb/test_apps/hcd/pytest_usb_hcd.py
+3 -2
View File
@@ -5,14 +5,15 @@ from pytest_embedded import Dut
from pytest_embedded_idf.utils import idf_parametrize
@pytest.mark.temp_skip_ci(targets=['esp32s2'], reason='lack of runners with usb_host_flash_disk tag')
@pytest.mark.temp_skip_ci(
targets=['esp32s2', 'esp32p4'], reason='lack of runners with usb_host_flash_disk tag, p4 rev3 migration, IDF-14832'
)
@pytest.mark.usb_host_flash_disk
@idf_parametrize(
'config,target',
[('default', 'esp32s2'), ('default', 'esp32s3'), ('default', 'esp32p4'), ('esp32p4_psram', 'esp32p4')],
indirect=['config', 'target'],
)
@pytest.mark.temp_skip_ci(targets=['esp32p4'], reason='p4 rev3 migration, IDF-14832')
def test_usb_hcd(dut: Dut) -> None:
if dut.target == 'esp32p4':
dut.run_all_single_board_cases(group='high_speed', reset=True)
components/usb/test_apps/usb_host/pytest_usb_host.py
+1 -1
View File
@@ -6,7 +6,7 @@ from pytest_embedded_idf.utils import idf_parametrize
@pytest.mark.temp_skip_ci(
targets=['esp32s2, esp32p4'], reason='lack of runners with usb_host_flash_disk tag, p4 rev3 migration, IDF-14832'
targets=['esp32s2', 'esp32p4'], reason='lack of runners with usb_host_flash_disk tag, p4 rev3 migration, IDF-14832'
)
@pytest.mark.usb_host_flash_disk
@idf_parametrize('target', ['esp32s2', 'esp32s3', 'esp32p4'], indirect=['target'])
examples/peripherals/.build-test-rules.yml
+14 -2
View File
@@ -512,11 +512,23 @@ examples/peripherals/twai/twai_error_recovery:
depends_components:
- esp_driver_twai
examples/peripherals/twai/twai_network:
examples/peripherals/twai/twai_network/twai_listen_only:
disable:
- if: SOC_TWAI_SUPPORTED != 1
disable_test:
- if: IDF_TARGET == "esp32p4"
- if: IDF_TARGET in ["esp32p4", "esp32h2"]
temporary: true
reason: p4 rev3 migration # TODO: IDF-14393
depends_components:
- esp_driver_twai
examples/peripherals/twai/twai_network/twai_sender:
disable:
- if: SOC_TWAI_SUPPORTED != 1
disable_test:
- if: IDF_TARGET in ["esp32p4", "esp32c5"]
temporary: true
reason: p4 rev3 migration # TODO: IDF-14393
depends_components:
examples/peripherals/usb/host/msc/pytest_usb_host_msc.py
+1 -1
View File
@@ -6,7 +6,7 @@ from pytest_embedded_idf.utils import idf_parametrize
@pytest.mark.temp_skip_ci(
targets=['esp32s2, esp32p4'], reason='lack of runners with usb_host_flash_disk tag,p4 rev3 migration, IDF-14832'
targets=['esp32s2', 'esp32p4'], reason='lack of runners with usb_host_flash_disk tag,p4 rev3 migration, IDF-14832'
)
@pytest.mark.usb_host_flash_disk
@idf_parametrize(
examples/peripherals/usb/host/usb_host_lib/pytest_usb_host_lib.py
+1 -1
View File
@@ -6,7 +6,7 @@ from pytest_embedded_idf.utils import idf_parametrize
@pytest.mark.temp_skip_ci(
targets=['esp32s2, esp32p4'], reason='lack of runners with usb_host_flash_disk tag,p4 rev3 migration, IDF-14832'
targets=['esp32s2', 'esp32p4'], reason='lack of runners with usb_host_flash_disk tag,p4 rev3 migration, IDF-14832'
)
@pytest.mark.usb_host_flash_disk
@idf_parametrize('target', ['esp32s2', 'esp32s3', 'esp32p4'], indirect=['target'])
tools/ci/idf_pytest/plugin.py
+12 -7
View File
@@ -25,12 +25,12 @@ from pytest_embedded.utils import to_list
from pytest_ignore_test_results.ignore_results import ChildCase
from pytest_ignore_test_results.ignore_results import ChildCasesStashKey
from .constants import CollectMode
from .constants import DEFAULT_SDKCONFIG
from .constants import PREVIEW_TARGETS
from .constants import SUPPORTED_TARGETS
from .constants import CollectMode
from .constants import PytestApp
from .constants import PytestCase
from .constants import SUPPORTED_TARGETS
from .utils import comma_sep_str_to_list
from .utils import format_case_id
from .utils import merge_junit_files
@@ -82,7 +82,11 @@ class IdfPytestEmbedded:
self._single_target_duplicate_mode = single_target_duplicate_mode
self.apps_list = (
[os.path.join(idf_relpath(app.app_dir), app.build_dir) for app in apps if app.build_status == BuildStatus.SUCCESS]
[
os.path.join(idf_relpath(app.app_dir), app.build_dir)
for app in apps
if app.build_status == BuildStatus.SUCCESS
]
if apps is not None
else None
)
@@ -137,7 +141,7 @@ class IdfPytestEmbedded:
return PytestCase(
apps=[PytestApp(app_paths[i], targets[i], configs[i]) for i in range(count)],
item=item,
multi_dut_without_param=multi_dut_without_param
multi_dut_without_param=multi_dut_without_param,
)
def pytest_collectstart(self) -> None:
@@ -270,9 +274,10 @@ class IdfPytestEmbedded:
case = item_to_case_dict[item]
target = self.get_param(item, 'target', None)
if (
not case.is_single_dut_test_case and
target is not None and
target not in case.skip_targets
not case.is_single_dut_test_case
and target is not None
and target not in case.skip_targets
and not any([_t in target for _t in case.skip_targets if '|' not in _t])
):
filtered_items.append(item)
items[:] = filtered_items