refactor(tests): add missing sdkconfig files in the driver test

This commit is contained in:
morris
2026-01-02 23:41:41 +08:00
parent b4a987ae30
commit 980e8289a1
8 changed files with 28 additions and 7 deletions
@@ -6,6 +6,13 @@ from pytest_embedded_idf.utils import idf_parametrize
@pytest.mark.lp_i2s
@pytest.mark.parametrize(
'config',
[
'default',
],
indirect=True,
)
@idf_parametrize('target', ['esp32p4'], indirect=['target'])
def test_lp_i2s(dut: Dut) -> None:
dut.run_all_single_board_cases(timeout=200)
+1 -1
View File
@@ -611,7 +611,7 @@ static void sdio_intr_send(void *arg)
esp_err_t sdio_slave_send_queue(uint8_t *addr, size_t len, void *arg, TickType_t wait)
{
SDIO_SLAVE_CHECK(len > 0, "len <= 0", ESP_ERR_INVALID_ARG);
SDIO_SLAVE_CHECK(len > 0 && len <= 4092, "length out of range: (0, 4092]", ESP_ERR_INVALID_ARG);
SDIO_SLAVE_CHECK(esp_ptr_dma_capable(addr) && (uint32_t)addr % 4 == 0, "buffer to send should be DMA capable and 32-bit aligned",
ESP_ERR_INVALID_ARG);
@@ -51,8 +51,15 @@ def test_temperature_sensor_cbs_esp32c5(dut: Dut) -> None:
@pytest.mark.two_duts
@pytest.mark.parametrize('count', [2], indirect=True)
@pytest.mark.parametrize(
'config',
[
'release',
],
indirect=True,
)
@idf_parametrize('target', ['esp32s2', 'esp32c3', 'esp32s3', 'esp32c2', 'esp32c6', 'esp32c61'], indirect=['target'])
def test_temperature_phy_cases(case_tester: CaseTester) -> None: # type: ignore
for case in case_tester.test_menu:
if case.attributes.get('test_env', 'two_duts') == 'two_duts':
case_tester.run_all_multi_dev_cases(case=case, reset=True)
case_tester.run_multi_dev_case(case=case, reset=True)
@@ -54,8 +54,8 @@ def test_esp_flash_multi(dut: Dut) -> None:
@pytest.mark.parametrize(
'config, baud',
[
('esp32c2_xtal26m', '74880'),
('esp32c2_xtal26m_rom', '74880'),
('c2_xtal26m', '74880'),
('c2_xtal26m_rom', '74880'),
],
indirect=True,
)
@@ -10,7 +10,6 @@ from pytest_embedded_idf.utils import idf_parametrize
'config',
[
'release',
'i2c_isr_flash',
'text_in_flash_when_suspend',
],
indirect=True,
@@ -13,11 +13,11 @@
static const char *TAG = "touch_wakeup";
#define EXAMPLE_TOUCH_SAMPLE_CFG_NUM 1
#define EXAMPLE_TOUCH_CHANNEL_NUM 3
#define EXAMPLE_TOUCH_CHANNEL_NUM 2
#define EXAMPLE_TOUCH_CHAN_INIT_SCAN_TIMES 3
// If you want to change the wake-up channels, please make sure the channel GPIOs won't conflict to the EXT wakeup GPIOs
static int s_channel_id[EXAMPLE_TOUCH_CHANNEL_NUM] = {7, 8, 9};
static int s_channel_id[EXAMPLE_TOUCH_CHANNEL_NUM] = {8, 9};
// Active threshold to benchmark ratio. (i.e., touch will be activated when data >= benchmark * (1 + ratio))
static float s_thresh2bm_ratio[EXAMPLE_TOUCH_CHANNEL_NUM] = {
@@ -7,6 +7,14 @@ from pytest_embedded_idf.utils import soc_filtered_targets
@pytest.mark.generic
@pytest.mark.parametrize(
'config',
[
'deep_sleep',
'light_sleep',
],
indirect=True,
)
@idf_parametrize(
'target',
soc_filtered_targets('SOC_TOUCH_SENSOR_SUPPORTED == 1 and SOC_PM_SUPPORT_TOUCH_SENSOR_WAKEUP == 1'),