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ci(esp_tee): Remove incorrect error checks for TEE flash protection tests

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- Also fixed coverity issue from TEE secure storage
This commit is contained in:
Laukik Hase
2025-11-05 16:21:28 +05:30
parent 8410210c9a
commit a45758dede
2 changed files with 9 additions and 20 deletions
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components/esp_tee/subproject/components/tee_sec_storage/tee_sec_storage.c
+3 -2
View File
@@ -643,11 +643,12 @@ esp_err_t esp_tee_sec_storage_ecdsa_sign_pbkdf2(const esp_tee_sec_storage_pbkdf2
return ESP_ERR_INVALID_ARG;
}
hmac_key_id_t key_id = (hmac_key_id_t)(CONFIG_SECURE_TEE_PBKDF2_EFUSE_HMAC_KEY_ID);
if (key_id < 0 || key_id >= HMAC_KEY_MAX) {
int cfg_key_id = (int)CONFIG_SECURE_TEE_PBKDF2_EFUSE_HMAC_KEY_ID;
if (cfg_key_id < 0 || cfg_key_id >= HMAC_KEY_MAX) {
return ESP_ERR_INVALID_ARG;
}
hmac_key_id_t key_id = (hmac_key_id_t)cfg_key_id;
esp_efuse_block_t blk = (esp_efuse_block_t)(EFUSE_BLK_KEY0 + key_id);
if (esp_efuse_get_key_purpose(blk) != ESP_EFUSE_KEY_PURPOSE_HMAC_UP) {
ESP_LOGE(TAG, "HMAC key is not burnt in the specified eFuse block ID");
components/esp_tee/test_apps/tee_test_fw/main/test_esp_tee_flash_prot.c
+6 -18
View File
@@ -48,12 +48,6 @@ __attribute__((unused)) static const uint32_t mmu_op_fail_seq[8] = {[0 ... 7] =
} while (0)
#endif
#if SOC_TEE_FLASH_OP_FAIL_FAULT
#define CHECK_FLASH_OP_FAIL(err) TEST_ESP_ERR(ESP_FAIL, err)
#else
#define CHECK_FLASH_OP_FAIL(err) do { (void)(err); esp_restart(); } while (0)
#endif
static const char *TAG = "test_esp_tee_flash_prot";
static void set_boot_count_in_nvs(uint8_t boot_count)
@@ -146,8 +140,7 @@ static void test_esp_partition_api_r(const esp_partition_t *part)
TEST_ASSERT_NOT_NULL(part);
uint8_t buf_r[128];
memset(buf_r, 0x00, sizeof(buf_r));
esp_err_t err = esp_partition_read(part, 0x00, buf_r, sizeof(buf_r));
CHECK_FLASH_OP_FAIL(err);
esp_partition_read(part, 0x00, buf_r, sizeof(buf_r));
}
static void test_esp_partition_api_w(const esp_partition_t *part)
@@ -155,15 +148,13 @@ static void test_esp_partition_api_w(const esp_partition_t *part)
TEST_ASSERT_NOT_NULL(part);
uint8_t buf_w[128];
memset(buf_w, 0xA5, sizeof(buf_w));
esp_err_t err = esp_partition_write(part, 0x00, buf_w, sizeof(buf_w));
CHECK_FLASH_OP_FAIL(err);
esp_partition_write(part, 0x00, buf_w, sizeof(buf_w));
}
static void test_esp_partition_api_e(const esp_partition_t *part)
{
TEST_ASSERT_NOT_NULL(part);
esp_err_t err = esp_partition_erase_range(part, 0x00, SPI_FLASH_SEC_SIZE);
CHECK_FLASH_OP_FAIL(err);
esp_partition_erase_range(part, 0x00, SPI_FLASH_SEC_SIZE);
}
static void test_esp_partition_api(void)
@@ -267,22 +258,19 @@ static void test_esp_flash_api_r(uint32_t paddr)
{
uint8_t buf_r[128];
memset(buf_r, 0x00, sizeof(buf_r));
esp_err_t err = esp_flash_read(NULL, buf_r, paddr, sizeof(buf_r));
CHECK_FLASH_OP_FAIL(err);
esp_flash_read(NULL, buf_r, paddr, sizeof(buf_r));
}
static void test_esp_flash_api_w(uint32_t paddr)
{
uint8_t buf_w[128];
memset(buf_w, 0xA5, sizeof(buf_w));
esp_err_t err = esp_flash_write(NULL, buf_w, paddr, sizeof(buf_w));
CHECK_FLASH_OP_FAIL(err);
esp_flash_write(NULL, buf_w, paddr, sizeof(buf_w));
}
static void test_esp_flash_api_e(uint32_t paddr)
{
esp_err_t err = esp_flash_erase_region(NULL, paddr, SPI_FLASH_SEC_SIZE);
CHECK_FLASH_OP_FAIL(err);
esp_flash_erase_region(NULL, paddr, SPI_FLASH_SEC_SIZE);
}
static void test_esp_flash_api(void)