Replace *common_components with specific driver dependencies across all
peripheral driver test apps and examples to prevent unnecessary CI
triggers
when common_components change.
This follows the same pattern established in TWAI driver commit:
6d21cc6c29
Changes made:
- 26 component test apps updated
(esp_driver_*/test_apps/.build-test-rules.yml)
- 1 driver test app updated
(components/driver/test_apps/.build-test-rules.yml)
- Key examples updated in examples/peripherals/.build-test-rules.yml
- Established standard dependency pattern: esp_hal_xxx, esp_hw_support,
soc
- Added esp_driver_gpio for GPIO-dependent drivers
- Removed conditional definitions for various RCC_ATOMIC macros across
multiple files, replacing them with a unified PERIPH_RCC_ATOMIC() macro.
- Updated instances where specific RCC_ATOMIC macros were used to ensure
consistent usage of PERIPH_RCC_ATOMIC().
- Deleted unused uart_share_hw_ctrl.h file as its functionality is now
integrated into the new structure.
This adds an assembler for the BitScrambler assembly language,
plus unit tests for it. It also adds the loopback driver,
which can do BitScrambler operations on memory-to-memory
transfers. Documentation is also included.
morris
Igor Udot
laokaiyao
Chen Jichang
Marek Fiala
Marius Vikhammer
Dong Heng
Jeroen Domburg