Replace *common_components with specific driver dependencies across all
peripheral driver test apps and examples to prevent unnecessary CI
triggers
when common_components change.
This follows the same pattern established in TWAI driver commit:
6d21cc6c29
Changes made:
- 26 component test apps updated
(esp_driver_*/test_apps/.build-test-rules.yml)
- 1 driver test app updated
(components/driver/test_apps/.build-test-rules.yml)
- Key examples updated in examples/peripherals/.build-test-rules.yml
- Established standard dependency pattern: esp_hal_xxx, esp_hw_support,
soc
- Added esp_driver_gpio for GPIO-dependent drivers
- Removed conditional definitions for various RCC_ATOMIC macros across
multiple files, replacing them with a unified PERIPH_RCC_ATOMIC() macro.
- Updated instances where specific RCC_ATOMIC macros were used to ensure
consistent usage of PERIPH_RCC_ATOMIC().
- Deleted unused uart_share_hw_ctrl.h file as its functionality is now
integrated into the new structure.